Automated optical metrology computer aided inspect

专利名称：Automated optical metrology computer

aided inspection station and method ofoperation

发明人：William J. Greene,Scott T. McAfee申请号：US15596873申请日：20170516

公开号：US20170249729A1公开日：20170831

专利附图：

摘要：An automated 3D Optical Metrology Scanning and Computer Aided InspectionSystem for dimensional inspection of precision manufactured parts. The system example

and implemented configuration is based within a relocatable cabinet providing ambientlight and optional temperature control. The cabinet further includes a part placementarea having an optical metrology scanner positioned over a multi-axis robotic armpositioned in the part placement area. The robotic arm is constructed and arranged togrip and manipulate parts within a field of view of the optical metrology scanner. Therobotic arm provides adequate multi-axis control to rotate and tilt and translate tpmanipulate the part to allow substantially every surface of the part to be scanned.Dimensional comparison and analysis software application provide geometric

conformance/deviation plus extraction of the dimensions indicated in the part computeraided design (CAD) model.

申请人：Level 3 Inspection, LLC

地址：Stuart FL US

国籍：US

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