Method and a device for calibrating equipment for

专利名称：Method and a device for calibrating

equipment for determining the surfaceuniformity of film or sheet material

发明人：Göran Åsemyr申请号：US09958710申请日：20011012公开号：US06594015B1公开日：20030715

专利附图：

摘要：Equipment for determining the surface uniformity of film or sheet material, inwhich the material is arranged to pass over a rotating measuring shaft, a light source

being arranged to illuminate the horizon formed by the outer surface of the materialexactly where it is in contact with the periphery of the measuring shaft, and also a lightdetector for detecting light transmitted from the light source and emitting

corresponding electric signals to subsequent signal-processing apparatus in order todetermine the dimensions, number and locations of the irregularities from the shadowsproduced by the surface irregularities. In a method for calibrating equipment of this type,at least one calibration shaft () is produced with a diameter corresponding to thediameter of the measuring shaft and the thickness of the material being calibrated, afterwhich a number of elevations (No.No.No.) are produced on the peripheral surface of theshaft and the actual dimensions of the elevations are determined. The calibration shaft isthereafter rotated in said measuring position and the dimensions of the elevations aredetermined from transmitted light detected by the light detector. Dimensions thusdetermined are compared with the actual dimensions of the elevations in order tocalibrate the equipment. A device for calibrating such equipment comprises a calibrationunit arranged to rotate a calibration shaft provided with elevations of predetermined sizeon its peripheral surface, in said measuring position, in order to determine the dimensionsof the elevations from the light transmission detected and compare them with the actualsize of the elevations for calibration of the equipment.

申请人：SEMYRE PHOTONIC SYSTEMS AB

代理机构：Nixon & Vanderhye

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